Standardless quantification of single fluid inclusions using synchrotron radiation induced X-ray fluorescence

被引:20
|
作者
Cauzid, J
Philippot, P
Somogyi, A
Ménez, B
Simionovici, A
Bleuet, P
机构
[1] Inst Phys Globe, Lab Geosci Marines, F-75252 Paris 05, France
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] Synchrotron Soleil, Diffabs Beamline, F-91192 Gif Sur Yvette, France
[4] Ecole Normale Super, F-69007 Lyon, France
关键词
fluid inclusion; quantitative analysis; synchrotron radiation; X-ray fluorescence;
D O I
10.1016/j.chemgeo.2005.09.012
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
Fluid inclusions are studied using synchrotron radiation induced mu-X-ray fluorescence (mu-SR-XRF). We analyse inclusions from the Brusson gold deposit, Italy. Several two-phase (liquid plus gas) inclusions or a single generation are used to compare a new standardless quantification procedure to previously published internal and external standardisation procedures. The three procedures are based oil an infinite homogeneous plane layer and the calculations are performed with a non-iterative fundamental parameter method. Results show a good agreement between the average of the calculated concentrations obtained with the three procedures and the corresponding crush-leach analysis. Cl, K, Ca. Fe, Cu, Zn and As crush-leach concentrations are within error bars of the t-SRXRF concentration estimates. Br crush-leach content is above mu-SR-XRF estimates. Ti, Cr, Mn, Ni and Pb were detected with mu-SR-XRF technique only. These elements show different concentrations from one inclusion to another, suggesting heterogeneous trapping of tiny, infra-microscopic solid phases. The good Correspondence between the results obtained using the three calibration procedures show that accurate standardless quantitative analysis of individual fluid inclusions is achievable. Statistical error calculation of the three procedures shows that the standardless quantification method yields more accurate results than the internal or external standard procedures. Uncertainties oil inclusion depths strongly affect calculated light element concentrations (Cl to Ca), whereas Mn and heavier elements concentration estimates are more sensitive to errors oil fluid inclusion thickness. Uncertainties of +/- 1 mu m or less on fluid inclusion thickness and depth yield statistical errors of similar to 50% on Cl concentration estimates and lower than 20% oil transition metals. This new standardless-mu-SR-XRF based quantification procedure is more precise than the previously established ones and is efficiently applied to multielementary analysis (Cl to Pb) of diluted individual fluid inclusions. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:165 / 183
页数:19
相关论文
共 50 条
  • [41] Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation
    Costa, ACM
    Anjos, MJ
    Moreira, S
    Lopes, RT
    de Jesus, EFO
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2003, 58 (12) : 2199 - 2204
  • [42] Size segregation behavior of heavy metals in superfine pulverized coal using synchrotron radiation-induced X-ray fluorescence
    Liu, Jiaxun
    Jiang, Xiumin
    Zhang, Yuchen
    Zhang, Hai
    Luo, Lei
    Wang, Xiaoye
    FUEL, 2016, 181 : 1081 - 1088
  • [43] HIGH SPATIAL RESOLUTION X-RAY FLUORESCENCE IMAGING BY IMAGE RECONSTRUCTION TECHNIQUE USING SYNCHROTRON RADIATION
    Takahashi, Mamoru
    Iida, Atsuo
    Gohshi, Yohichi
    ANALYTICAL SCIENCES, 1991, 7 : 1403 - 1404
  • [44] Microscopic X-ray fluorescence analysis and related methods with laboratory and synchrotron radiation sources - Plenary lecture
    Adams, F
    Janssens, K
    Snigirev, A
    JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1998, 13 (05) : 319 - 331
  • [45] Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L
    Streli, C.
    Pepponi, G.
    Wobrauschek, P.
    Jokubonis, C.
    Falkenberg, G.
    Zaray, Gy.
    Broekaert, J.
    Fittschen, U.
    Peschel, B.
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2006, 61 (10-11) : 1129 - 1134
  • [46] Soft X-ray diffractometer for synchrotron radiation
    Gau, TS
    Jean, YC
    Liu, KY
    Chung, CH
    Chen, CK
    Lai, SC
    Shu, CH
    Huang, YS
    Chao, CH
    Lee, YR
    Chen, CT
    Chang, SL
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 466 (03) : 569 - 575
  • [47] Conversion electron and X-ray Mossbauer spectroscopies using synchrotron radiation
    Mitsui, Takaya
    Seto, Makoto
    Masuda, Ryo
    Kobayashi, Yasuhiro
    Kitao, Shinji
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (09) : 7136 - 7139
  • [48] X-ray fluorescent analysis using synchrotron radiation: Subjects of research
    V. A. Trunova
    V. V. Zvereva
    Journal of Structural Chemistry, 2016, 57 : 1327 - 1333
  • [49] A microfocus X-ray fluorescence beamline at Indus-2 synchrotron radiation facility
    Tiwari, M. K.
    Gupta, P.
    Sinha, A. K.
    Kane, S. R.
    Singh, A. K.
    Garg, S. R.
    Garg, C. K.
    Lodha, G. S.
    Deb, S. K.
    JOURNAL OF SYNCHROTRON RADIATION, 2013, 20 : 386 - 389
  • [50] RECONSTRUCTION OF ELEMENTAL DISTRIBUTION IMAGES FROM SYNCHROTRON RADIATION X-RAY FLUORESCENCE SPECTRA
    Toque, Jay Arre
    Ide-Ektessabi, Ari
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2009, 23 (04): : 557 - 569