Electrical Treeing Breakdown Voltage of Epoxy/Hollow-silica Nanocomposites

被引：0
|
作者：
Shimura, Mirai [1 ]
Kurimoto, Muneaki [1 ]
Sugimoto, Shigeyuki [1 ]
Kato, Takeyoshi [1 ]
Tagawa, Kazuma [1 ]
Suzuoki, Yasuo [2 ]
机构：
[1] Nagoya Univ, Furo Cho,Chikusa Ku, Nagoya 4648603, Japan
[2] Aichi Inst Technol, Yakusa Cho, Toyota 4700392, Japan
来源：
2021 96TH IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP 2021) / 16TH IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE (IEEE NMDC 2021) | 2021年
关键词：
FUNCTIONALLY GRADED MATERIAL; PERMITTIVITY;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The relative permittivity of epoxy nanocomposites (NCs) containing hollow silica nanoparticles (epoxy/hollow-silica NC) is lower than that of the unfilled epoxy resin. The low permittivity in hollow silica nanoparticles is caused by the nanometric pores present in them; however, the effect of nanometric pores on the dielectric breakdown strength is unclear. In this study, we investigated the electrical treeing breakdown voltage (BDV) of epoxy/hollow-silica NC and compared it with that of the unfilled epoxy resin and epoxy nanocomposites containing solid silica nanoparticles (epoxy/solidsilica NC). The average size and the particle porosity of the hollow silica nanoparticles were approximately 100 nm and 48 vol%, respectively. The filler volume fraction of the silica nanoparticles in the NCs was 5 wt %. The breakdown test was performed using a needle-plate electrode with a gap of 3 mm. The average BDV of the epoxy/hollow-silica NC was almost the same as that of the unfilled epoxy resin and epoxy/solid-silica NC. These results suggest that the nanometric pores in the epoxy/ hollow-silica NC did not behave as defects to reduce the treeing BDV.
引用
收藏
页码：490 / 493
页数：4
相关论文
共 50 条
  • [41] Effect of Insulating Gases on Electrical Treeing in Epoxy Resin
    Han, Qinghua
    Iddrissu, Ibrahim
    Chen, Lujia
    Rowland, Simon
    2021 96TH IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP 2021) / 16TH IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE (IEEE NMDC 2021), 2021, : 482 - 485
  • [42] Influence of Nanoparticles on Electrical Treeing in Epoxy Based Dielectrics
    Divya, P.
    Preetha, P.
    2021 IEEE REGION 10 SYMPOSIUM (TENSYMP), 2021,
  • [43] Electrical Treeing Initiation and Propagation in Silicone Rubber Nanocomposites
    Jamil, A. A. A.
    Bashir, N.
    Ahmad, M. H.
    Arief, Y. Z.
    Kamarol, M.
    Mariatti, M.
    2013 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP), 2013, : 502 - 505
  • [44] The role of power quality in electrical treeing of epoxy resin
    Bahadoorsingh, S.
    Rowland, S. M.
    2007 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 2007, : 221 - 224
  • [45] Effect of Silica Nanoparticles on the Electrical Properties of Epoxy/Silver Nanowire Nanocomposites
    Oh, Won Kyo
    Kim, Jungmock
    Song, Jae Phil
    Lee, Seong Jae
    POLYMER-KOREA, 2016, 40 (04) : 614 - 621
  • [46] Electrical treeing in epoxy resin: Experimental investigation and simulation
    Sack, M
    Schwab, AJ
    Noskov, MD
    Malinovski, AS
    2000 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, VOLS. I & II, 2000, : 313 - 316
  • [47] Effects of Silane Coupling Agents on the Electrical Properties of Silica/Epoxy Nanocomposites
    Li, He
    Wang, Chuang
    Guo, Zihao
    Wang, Haoran
    Zhang, Yuxuan
    Hong, Rui
    Peng, Zongren
    2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2, 2016, : 1036 - 1039
  • [48] Effect of Surface-Modified Nanosilicas on the Electrical Breakdown Strength in Epoxy Nanocomposites
    Park, Jae-Jun
    Lee, Jae-Young
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2023, 30 (01) : 3 - 10
  • [49] Electrical Treeing and Reverse Tree Growth in an Epoxy Resin
    Zheng, Hualong
    Rowland, Simon M.
    Iddrissu, Ibrahim
    Lv, Zepeng
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2017, 24 (06) : 3966 - 3973
  • [50] Unveiling frequency dependence of electrical treeing degradation in epoxy resin under bipolar square wave voltage
    Zhang, Chuang
    Xiang, Jiao
    Ruan, Yang
    Cui, Huize
    Wang, Shihang
    Li, Jianying
    Li, Shengtao
    JOURNAL OF APPLIED PHYSICS, 2024, 136 (22)
12345