Precise determination of elastic constants by high-resolution inelastic X-ray scattering

被引:21
作者
Fukui, Hiroshi [1 ,2 ]
Katsura, Tomoo [1 ]
Kuribayashi, Takahiro [3 ]
Matsuzaki, Takuya [1 ]
Yoneda, Akira [1 ]
Ito, Eiji [1 ]
Kudoh, Yasuhiro [3 ]
Tsutsui, Satoshi
Baron, Alfred Q. R. [2 ]
机构
[1] Okayama Univ, Inst Study Earths Interior, Okayama 7008530, Japan
[2] RIKEN, SPring Harima Inst 8, Mat Dynam Lab, Tokyo, Japan
[3] Tohoku Univ, Inst Mineral Petrol & Econ Geol, Sendai, Miyagi 980, Japan
基金
日本学术振兴会;
关键词
inelastic X-ray scattering; elastic constants; sound velocity; single crystal; MgO; the Christoffel equation;
D O I
10.1107/S0909049508023248
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.
引用
收藏
页码:618 / 623
页数:6
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