Determination of the elastic modulus of mesoporous silica thin films by x-ray reflectivity via the capillary condensation of water

被引：34
|
作者：
Dourdain, S. [1 ]
Britton, D. T. [2 ]
Reichert, H. [3 ]
Gibaud, A. [4 ]
机构：
[1] CEA Grenoble, UMR 5819, Grenoble, France
[2] Univ Cape Town, ZA-7701 Rondebosch, South Africa
[3] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[4] Univ Maine, CNRS, Lab Phys Etat Condense, UMR 6087, F-72085 Le Mans, France
来源：
APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 18期
关键词：
adsorption; condensation; deformation; elastic moduli; mesoporous materials; nanostructured materials; porosity; silicon compounds; thin films; X-ray reflection;
D O I：
10.1063/1.2996412
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The mechanical properties of mesoporous silica films were characterized by x-ray reflectivity measurements. The measurements provide information on the deformation of the pores and the walls induced by the adsorption of water in the pores. The analysis of the nanoscaled deformations supplies a method to determine the elastic modulus E of thin porous films. The nanodeformation of the porous network during its filling with water is interpreted in three regimes of isotherm sorptions.
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页数：3
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