Comparative analysis of Bayesian and classical approaches for software reliability measurement

被引:0
作者
Wandji, Ketchiozo T. [1 ]
Sarkani, Shahryar [1 ]
Eveleigh, Timothy [1 ]
Holzer, Thomas H. [1 ]
Keiller, Peter. A. [2 ]
机构
[1] George Washington Univ, Dept Engn Management & Syst Engn, Washington, DC 20052 USA
[2] Howard Univ, Dept Syst & Comp Sci, Washington, DC 20052 USA
来源
2013 IEEE INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING WORKSHOPS (ISSREW) | 2013年
关键词
software reliability models; bayesian inference; classical inference; software reliability measurement; comparative analysis;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Software failure remains an important cause of reported system outage. Yet, developing reliable software is still not well understood by the programmer, the Software Engineer and the Program manager. Software reliability growth models (SRGMs) provide a framework to analyze software failures by using past failure data to predict the reliability of the software. Most models that have been used have limitations in predicting accurately. There is a need to conduct research aimed at improving the performance of these models. To accurately predict reliability, the model's parameters should be estimated in such a way that the mathematical function of the model fits with the failure data. While the majority of previous software reliability studies have used classical methods to estimate model's parameters, a few other studies have used a Bayesian approach. Bayesian approaches allow the incorporation of prior information into models and they have been claimed to be more successful than classical approaches in certain situations. Our research goal is to investigate if the use of Bayesian methods improves the predictability of SRGMs by conducting a direct comparative analysis of Bayesian and classical approaches for software reliability assessment.
引用
收藏
页码:9 / +
页数:2
相关论文
共 7 条
  • [1] EVALUATION OF COMPETING SOFTWARE-RELIABILITY PREDICTIONS
    ABDELGHALY, AA
    CHAN, PY
    LITTLEWOOD, B
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1986, 12 (09) : 950 - 967
  • [2] Anjum Mohd., 2013, IJ INFORM TECHNOLOGY, V02, P1
  • [3] Crow L.H., 1974, RELIABILITY BIOMETRY, P379
  • [4] Keiller P.A., 2002, 2002 IEEE P ANN REL
  • [5] Keiller P.A., 2005, P ANN REL MAINT S
  • [6] Enhancing the predictive performance of the Goel-Okumoto software reliability growth model
    Keiller, PA
    Mazzuchi, TA
    [J]. ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM - 2000 PROCEEDINGS, 2000, : 106 - 112
  • [7] Meinhold R.J, 1983, BAYESIAN ANAL COMMON, P20052