ESD Effect Test Research on Electronic Devices and Chips

被引：0
|
作者：
Jie, Yang [1 ]
机构：
[1] Shijiazhuang Mech Engn Coll, Electrostat & Electromagnet Protect Inst, Shijiazhuang 050003, Peoples R China
来源：
Proceedings of the 6th International Conference on Applied Electrostatics | 2008年
关键词：
electronic devices and chips; ESD effect; threshold;
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Nearly 40 kinds of electronic devices and chips were test in this research, such as capacitances, diodes, dynatrons, manostats, analog ICs, digital ICs, and so on. Their ESD effect especially the threshold was found. The results were more important for higher quality and reliability of device technologies.
引用
收藏
页码：318 / 320
页数：3
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