Temperature-dependent properties of Pd/GaN Schottky type hydrogen sensors with Cl2 plasma surface treatments

被引:9
作者
Chen, Tai-You [1 ]
Chen, Huey-Ing [2 ]
Chiu, Po-Shun [1 ]
Huang, Chien-Chang [1 ]
Hsu, Chi-Shiang [1 ]
Chou, Po-Cheng [1 ]
Liu, Rong-Chau [3 ]
Liu, Wen-Chau [1 ]
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Dept Elect Engn, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Dept Chem Engn, Tainan 70101, Taiwan
[3] Chung Shan Inst Sci & Technol, Tao Yuan, Taiwan
关键词
Schottky diode; Surface roughness; Plasma treatment; GaN; Pd; SENSING CHARACTERISTICS; THIN-FILMS; POROUS GAN; DIODE; ZNO; NANOTUBES; MOS;
D O I
10.1016/j.matchemphys.2012.04.038
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature-dependent hydrogen sensing properties of Pd/GaN Schottky type sensors with different Cl-2 plasma surface treated times are studied and demonstrated. The sensing behaviors are studied in terms of Schottky barrier height variation Delta(phi B), sensing response S-r, and transient-state response times. The highest sensing response (S-r) values of 7.1 x 10(4) and 2.12 x 10(5) are obtained in forward- and reverse-bias voltages, respectively, upon exposure to a 10,000 ppm H-2/air gas at 30 degrees C. In addition, a correspondingly large Schottky barrier height variation Delta(phi B) of 0.38 eV is found. This could be attributed to the effective dissociation of hydrogen molecules due to a rougher Pd surface and lower baseline current. Moreover, the studied devices with Cl-2 plasma surface treatment have a stable and widespread reverse voltage operation regime. From transient-state behaviors measurement, the studied device with a 30 s plasma surface treatment shows the overshooting phenomenon and fast response (recovery) time of 4 (5) S. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:150 / 157
页数:8
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