Observation of domain dynamics and nanoscale control of domains in ferroelectric materials with scanning probe microscope

被引：3
作者：
Hong, J
Park, SI
Nho, K
Kwun, SI
Khim, ZG
机构：
[1] PSIA Corp, Seoul 137070, South Korea
[2] Seoul Natl Univ, Condensed Matter Res Inst, Seoul 151742, South Korea
[3] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
来源：
FERROELECTRICS | 1999年 / 229卷 / 1-4期
关键词：
scanning probe microscope; electrostatic force microscope; ferroelectric domain; domain reversal;
D O I：
10.1080/00150199908224329
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have investigated domain structure and dynamics of a triglycine sulfate (TGS) single crystal with a dynamic contact mode electrostatic force microscope (DC-EFM), which is operated in contact mode. DC-EFM can overcome a problem in conventional noncontact EFM measurement, The temperature dependence of surface charge density was measured by a nulling technique, We also investigated local domain switching behaviors of TGS single crystal and PZT thin film. Complex pattern was written on a PZT thin film by the polarization reversal. A writing capability such as a writing speed and voltage dependence in PZT film has been studied by DC-EFM.
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收藏
页码：131 / 140
页数：10
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