Standardization of surface potential measurements of graphene domains

被引：202
作者：
Panchal, Vishal [1 ,2 ]
Pearce, Ruth [1 ]
Yakimova, Rositza [3 ]
Tzalenchuk, Alexander [1 ,2 ]
Kazakova, Olga [1 ]
机构：
[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[2] Univ London, Egham TW20 0EX, Surrey, England
[3] Linkoping Univ, S-58183 Linkoping, Sweden
来源：
SCIENTIFIC REPORTS | 2013年 / 3卷
关键词：
EPITAXIAL GRAPHENE; FORCE MICROSCOPY; LAYERS;
D O I：
10.1038/srep02597
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains in ambient conditions with values Phi(1LG) similar to 4.55 +/- 0.02 eV and Phi(2LG) similar to 4.44 +/- 0.02 eV for single-and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.
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页数：8
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