Probing the trap states in N-i-P Sb2(S,Se)3 solar cells by deep-level transient spectroscopy

被引:17
作者
Lian, Weitao [1 ,2 ]
Tang, Rongfeng [1 ,2 ]
Ma, Yuyuan [1 ]
Wu, Chunyan [1 ]
Chen, Chao [1 ]
Wang, Xiaomin [1 ]
Fang, Fang [1 ]
Zhang, Jianwang [1 ]
Wang, Zheng [1 ]
Ju, Huanxin [3 ]
Zhu, Changfei [1 ,2 ]
Chen, Tao [1 ,2 ]
机构
[1] Univ Sci & Technol China, Sch Chem & Mat Sci, Dept Mat Sci & Engn, Hefei Natl Lab Phys Sci MicroscaleCAS Key Lab Mat, Hefei 230026, Anhui, Peoples R China
[2] Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
[3] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
THERMALLY STIMULATED CAPACITANCE; ADMITTANCE SPECTROSCOPY; IMPURITY LEVELS; CARRIER TRAPS; EFFICIENCY; DLTS;
D O I
10.1063/5.0020244
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study, we provide fundamental understanding on defect properties of the Sb-2(S,Se)(3) absorber film and the impact on transmission of photo-excited carriers in N-i-P architecture solar cells by both deep level transient spectroscopy (DLTS) and optical deep level transient spectroscopy (ODLTS) characterizations. Through conductance-voltage and temperature-dependent current-voltage characterization under a dark condition, we find that the Sb-2(S,Se)(3) solar cell demonstrates good rectification and high temperature tolerance. The DLTS results indicates that there are two types of deep level hole traps H1 and H2 with active energy of 0.52 eV and 0.76 eV in the Sb-2(S,Se)(3) film, and this defect property is further verified by ODLTS. The two traps hinder the transmission of minority carrier (hole) and pinning the Fermi level, which plays a negative role in the improvement of open-circuit voltage for Sb-2(S,Se)(3) solar cells. This research suggests a critical direction toward the efficiency improvement of Sb-2(S,Se)(3) solar cells. Published under license by AIP Publishing.
引用
收藏
页数:7
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