Structural and thermal analysis of a new phase change optical memory material: Ag-Sb-Te

被引：0

作者：

Sharma, YD ^{[1
]}

Bhatnagar, C ^{[1
]}

Bhatnagar, PK ^{[1
]}

机构：

[1] Univ Delhi, Dept Elect Sci, New Delhi 110021, India

来源：

DESIGN, FABRICATION, AND CHARACTERIZATION OF PHOTONIC DEVICES II | 2001年 / 4594卷

关键词：

phase change optical memory; Ag-Sb-Te; DTA; SEM; TEM and optical disks;

D O I：

10.1117/12.446584

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Phase change optical recording disks using have been found to demonstrate long thermal stability of the amorphous recording marks. The thermal analysis of Ag-Sb-Te material was studied using Differential Thermal Analysis (DTA) and structural analysis of the material were studied by X Ray Diffraction (XRD), Scanning electron microscopy (SEM) and Transmission electron microscopy (TEM) respectively. The films were studied for both the cases: before and after annealing and it was concluded that the alloy (Ag-Sb-Te) could be used as a phase change optical memory material.

引用

页码：489 / 497

页数：9