Structural and thermal analysis of a new phase change optical memory material: Ag-Sb-Te

被引：0
|
作者：
Sharma, YD [1 ]
Bhatnagar, C [1 ]
Bhatnagar, PK [1 ]
机构：
[1] Univ Delhi, Dept Elect Sci, New Delhi 110021, India
来源：
DESIGN, FABRICATION, AND CHARACTERIZATION OF PHOTONIC DEVICES II | 2001年 / 4594卷
关键词：
phase change optical memory; Ag-Sb-Te; DTA; SEM; TEM and optical disks;
D O I：
10.1117/12.446584
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Phase change optical recording disks using have been found to demonstrate long thermal stability of the amorphous recording marks. The thermal analysis of Ag-Sb-Te material was studied using Differential Thermal Analysis (DTA) and structural analysis of the material were studied by X Ray Diffraction (XRD), Scanning electron microscopy (SEM) and Transmission electron microscopy (TEM) respectively. The films were studied for both the cases: before and after annealing and it was concluded that the alloy (Ag-Sb-Te) could be used as a phase change optical memory material.
引用
收藏
页码：489 / 497
页数：9
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