Design Space Exploration for the Design of Reliable SRAM-based FPGA Systems

被引:9
作者
Bolchini, Cristiana [1 ]
Miele, Antonio [1 ]
机构
[1] Politecn Milan, Dip Elettron & Informaz, I-20133 Milan, Italy
来源
23RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2008年
关键词
D O I
10.1109/DFT.2008.8
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a design space exploration approach for the design of SRAM-based FPGAs with Single Event Upsets fault mitigation capabilities, exploiting the feature of partial, dynamic reconfiguration offered by the target platform. In fact, in this senario, several techniques are available and they can be applied at different granularity levels; thus, We Propose a Support for exploring the different alternatives by means of a framework taking into account several figures of merit, based on. genetic algorithms. The several elements taken into account for evaluating the different solutions are here analyzed and discussed, and the application of the methodology and framework to some case studies is reported, allowing both a tuning of the metrics and the analysis of the identified most interesting solutions, which do not correspond, in general, to the trivial ones.
引用
收藏
页码:332 / 340
页数:9
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