SEU sensitivity of Virtex configuration logic

被引：12

作者：

Alderighi, M ^{[1
]}

Candelori, A

Casini, F

D'Angelo, S

Mancini, M

Paccagnella, A

Pastore, S

Sechi, GR

机构：

[1] Ist Nazl Astrofis, Ist Astrofis Spaziale & Fis Cosm, I-20133 Milan, Italy

[2] Ist Nazl Fis Nucl, I-35131 Padua, Italy

[3] Sanitas EG Srl, I-20122 Milan, Italy

[4] Univ Padua, Dipartimento Ingn Informaz, I-35131 Padua, Italy

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 06期

关键词：

field programmable gate arrays (FPGA); heavy ion radiation effects; radiation effects; semiconductor device radiation testing; single event effects;

D O I：

10.1109/TNS.2005.860741

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a strategy of investigation of SEU upset mechanisms in the configuration logic of Virtex I devices. Measurement procedures specifically addressing configuration logic and a hardware set up for radiation testing are described. The results of a heavy ion radiation test are then presented. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.

引用

页码：2462 / 2467

页数：6

共 14 条

[1] A tool for injecting SEU-like faults into the configuration control mechanism of Xilinx Virtex FPGAs [J].

Alderighi, M ;

Casini, F ;

D'Angelo, S ;

Mancini, M ;

Marmo, A ;

Pastore, S ;

Sechi, GR .

18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2003, :71-78

[2]

[Anonymous], 1999, OR US MAN

[3]

[Anonymous], 1996, STOPPING RANGE IONS

[4]

BISELLO D, 2003, 7 EUR C RAD ITS EFF

[5]

CAFFREY M, 2002, INT C MIL AER APPL P

[6]

CARMICHAEL C, 2001, INT C MIL AER APPL P

[7] SEU cross sections derived from a diffusion analysis [J].

Edmonds, LD .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (06) :3207-3217

[8]

FULLER E, 1999, INT C MIL AER APPL P

[9]

FULLER E, 2000, INT C MIL AER APPL P

[10]

FULLER E, 2000, IEEE NUCL SPAC RAD E

← 1 2 →