light-induced metastable defects;
chalcogenide glasses;
density of defect states;
thermally stimulated currents;
STIMULATED CURRENT MEASUREMENTS;
AMORPHOUS CHALCOGENIDES;
STEADY-STATE;
SEMICONDUCTORS;
PHOTOCONDUCTIVITY;
CONDUCTIVITY;
CAPACITANCE;
INSULATORS;
CURRENTS;
SILICON;
D O I:
10.1080/01411594.2015.1031665
中图分类号:
O7 [晶体学];
学科分类号:
0702 ;
070205 ;
0703 ;
080501 ;
摘要:
Thin films of chalcogenide glasses in a binary system of Se90X10 (X = Sb, In and Ag) have been prepared by the vacuum evaporation technique. Thermally stimulated current measurements have been made to find out the trap density in these materials. To study light-induced defects in these materials, white light of intensity 1200 lux is shown on the amorphous films in vacuum for different exposure times. It is observed that the density of traps increases with exposure time, indicating the appearance of light-induced metastable defects in these materials.
机构:
Department of Physic DAV College,Kanpur 208001,India
2. Material Science Programme ⅡT Kanpur 208016,India
3. Epsilonium Systems Commercial ComDepartment of Physic DAV College,Kanpur 208001,India
2. Material Science Programme ⅡT Kanpur 208016,India
3. Epsilonium Systems Commercial Com
Rashmi CHAUHAN
Amit Kumar SRIVASTAVA
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机构:Department of Physic DAV College,Kanpur 208001,India
2. Material Science Programme ⅡT Kanpur 208016,India
3. Epsilonium Systems Commercial Com
Amit Kumar SRIVASTAVA
Arvind TRIPATHI
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h-index: 0
机构:Department of Physic DAV College,Kanpur 208001,India
2. Material Science Programme ⅡT Kanpur 208016,India
3. Epsilonium Systems Commercial Com
Arvind TRIPATHI
Krishna Kant SRIVASTAVA
论文数: 0引用数: 0
h-index: 0
机构:Department of Physic DAV College,Kanpur 208001,India
2. Material Science Programme ⅡT Kanpur 208016,India
3. Epsilonium Systems Commercial Com
机构:
Taibah Univ, Fac Sci & Arts, Dept Phys, Al Ula, Medina, Saudi Arabia
Ain Shams Univ, Dept Phys, Thin Film Lab, Fac Educ, POB 11757, Cairo, EgyptTaibah Univ, Fac Sci & Arts, Dept Phys, Al Ula, Medina, Saudi Arabia
Ammar, A. H.
Farag, A. A. M.
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机构:
Ain Shams Univ, Dept Phys, Thin Film Lab, Fac Educ, POB 11757, Cairo, Egypt
Aljouf Univ, Fac Sci & Arts, Dept Phys, Aljouf, Saudi ArabiaTaibah Univ, Fac Sci & Arts, Dept Phys, Al Ula, Medina, Saudi Arabia
Farag, A. A. M.
Abo-Ghazala, M. S.
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h-index: 0
机构:
Menoufia Univ, Fac Sci, Dept Phys, Shebin El Koum, EgyptTaibah Univ, Fac Sci & Arts, Dept Phys, Al Ula, Medina, Saudi Arabia
Abo-Ghazala, M. S.
Farid, A. M.
论文数: 0引用数: 0
h-index: 0
机构:
Ain Shams Univ, Dept Phys, Thin Film Lab, Fac Educ, POB 11757, Cairo, EgyptTaibah Univ, Fac Sci & Arts, Dept Phys, Al Ula, Medina, Saudi Arabia