Surface x-ray diffraction analysis using a genetic algorithm: the case of Sn/Cu(100)-(3√2 x √2)R45°

被引：9
作者：
Martinez-Blanco, J. [1 ,2 ]
Joco, V. [1 ,2 ]
Quiros, C. [3 ]
Segovia, P. [1 ,2 ]
Michel, E. G. [1 ,2 ]
机构：
[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Inst Univ Ciencia Mat Nicolas Cabrera, E-28049 Madrid, Spain
[3] Univ Oviedo, Dept Fis, CINN, E-33007 Oviedo, Spain
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 2009年 / 21卷 / 13期
关键词：
METAL MONOLAYERS; TEMPERATURE; TRANSITION; COPPER; LAYERS; LEED; LEAD;
D O I：
10.1088/0953-8984/21/13/134011
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The application of genetic algorithms to the analysis of surface x-ray diffraction data is discussed and the implementation of a genetic algorithm of evolutionary type is described in detail. The structure of Sn/Cu(100)-(3 root 2 x root 2)R45 degrees is determined on the basis of surface x-ray diffraction data analysed using this algorithm. The results are compared to previous findings using other techniques.
引用
收藏
页数：13
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