Band-like transport in high mobility unencapsulated single-layer MoS2 transistors

被引:363
作者
Jariwala, Deep [1 ]
Sangwan, Vinod K. [1 ]
Late, Dattatray J. [1 ]
Johns, James E. [1 ]
Dravid, Vinayak P. [1 ]
Marks, Tobin J. [1 ,2 ]
Lauhon, Lincoln J. [1 ]
Hersam, Mark C. [1 ,2 ,3 ]
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
[3] Northwestern Univ, Dept Med, Evanston, IL 60208 USA
基金
美国国家科学基金会;
关键词
VALLEY POLARIZATION; SCATTERING MOBILITY; ELECTRON-MOBILITY; SILICON; PHOTOTRANSISTORS;
D O I
10.1063/1.4803920
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ultra-thin MoS2 has recently emerged as a promising two-dimensional semiconductor for electronic and optoelectronic applications. Here, we report high mobility (>60 cm(2)/Vs at room temperature) field-effect transistors that employ unencapsulated single-layer MoS2 on oxidized Si wafers with a low level of extrinsic contamination. While charge transport in the sub-threshold regime is consistent with a variable range hopping model, monotonically decreasing field-effect mobility with increasing temperature suggests band-like transport in the linear regime. At temperatures below 100 K, temperature-independent mobility is limited by Coulomb scattering, whereas, at temperatures above 100 K, phonon-limited mobility decreases as a power law with increasing temperature. (C) 2013 AIP Publishing LLC.
引用
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页数:4
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