Influence of contacts and substrate on semi-insulating GaAs detectors

被引:12
|
作者
Irsigler, R
Geppert, R
Goppert, R
Ludwig, J
Rogalla, M
Runge, K
Schmid, T
Webel, M
Weber, C
机构
[1] Albert-Ludwigs-Univ. Freiburg, Fakultät für Physik, D-79104 Freiburg im Breisgau
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1997年 / 395卷 / 01期
关键词
D O I
10.1016/S0168-9002(97)00633-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
It is commonly observed, that semi-insulating GaAs detectors show leakage current densities between 1 and several 100 nA/mm(2). Also the breakdown voltage of those surface barrier detectors varies between 100 and 270 V for 200 mu m thick devices. Moreover, the charge collection efficiency for alpha particles shows a strong correlation with the leakage current density of the detector. The presented measurements show, that the leakage current density is primarily determined by the substrate resistivity and not by the Schottky contact parameters.
引用
收藏
页码:71 / 75
页数:5
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