The upgraded LTP-V at SLS

被引：7

作者：

Flechsig, U. ^{[1
]}

Jaggi, A. ^{[1
]}

Krempasky, J. ^{[1
]}

Spielmann, S. ^{[1
]}

Thominet, V. ^{[1
]}

机构：

[1] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2013年 / 710卷

关键词：

Metrology; LTP; Slope error; EPICS;

D O I：

10.1016/j.nima.2012.10.114

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Since 2005 the Swiss Light Source (SLS) has been operating a Long Trace Profiler (LTP)-V from Ocean Optics in its metrology laboratory to measure the synchrotron optics for SLS. In 2012 we finished a significant upgrade to improve the accuracy, reliability and measurement efficiency in particular for the calibration of adaptive optics. Folding mirrors with figure errors <lambda/100 and an additional linear encoder have been installed, the Id CCD detector with 2048 pixels has been replaced by a 16 mega-pixel CCD camera with gigabit ethernet interface GigE, the monolithic software has been replaced by a modular, full- EPICS compatible system based on a new LTP plugin for the areaDetector software for image processing. The plugin allows slope determination in real time i.e. per frame. (c) 2012 Elsevier B.V. All rights reserved.

引用

页码：13 / 16

页数：4

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