Exact, approximate and asymptotic solutions of the Klein-Gordon integral equation

被引:3
作者
Fabrikant, V. I. [1 ]
Karapetian, E. [2 ]
Kalinin, S. V. [3 ]
机构
[1] Archambault Jail, Ste Anne Des Plaines, PQ, Canada
[2] Suffolk Univ, Dept Math & Comp Sci, Boston, MA 02114 USA
[3] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
关键词
Exact solution; Integral equations; Klein-Gordon; Potential theory; Series expansion; PIEZORESPONSE FORCE MICROSCOPY; ACOUSTIC MICROSCOPY; NANOSCALE; DEVICES; SPECTROSCOPY; SURFACE;
D O I
10.1007/s10665-019-09996-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Interaction of the highly localized probe of scanning probe microscopy with solid surfaces with mobile electronic or ionic carriers leads to the redistribution of mobile carriers at the tip surface junction. For small probe biases, this problem is equivalent to the Debye screening, described by Klein-Gordon (K-G) integral equation. Here, an exact solution to the K-G equation is derived for the case of a circle in the form of a convergent series expansion of the solution, which is effective for relatively small values of the inverse Debye length, k. Also, a reasonably accurate solution is derived for large values of parameter k by using the method of collocation. A surprisingly simple asymptotic solution is derived for very large values of k, which is valid for the arbitrary right-hand side of the equation. The same methods can be used for the case of elliptic domain.
引用
收藏
页码:141 / 156
页数:16
相关论文
共 57 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction [J].
Alvarez, T ;
Kalinin, SV ;
Bonnell, DA .
APPLIED PHYSICS LETTERS, 2001, 78 (07) :1005-1007
[3]   The partially reversible formation of Li-metal particles on a solid Li electrolyte: applications toward nanobatteries [J].
Arruda, Thomas M. ;
Kumar, Amit ;
Kalinin, Sergei V. ;
Jesse, Stephen .
NANOTECHNOLOGY, 2012, 23 (32)
[4]   Mapping Irreversible Electrochemical Processes on the Nanoscale: Ionic Phenomena in Li Ion Conductive Glass Ceramics [J].
Arruda, Thomas M. ;
Kumar, Amit ;
Kalinin, Sergei V. ;
Jesse, Stephen .
NANO LETTERS, 2011, 11 (10) :4161-4167
[5]   Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future [J].
Balke, Nina ;
Bdikin, Igor ;
Kalinin, Sergei V. ;
Kholkin, Andrei L. .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (08) :1629-1647
[6]  
Bao W, 2012, SCIENCE, V338, P1317, DOI [10.1126/science.1227977, 10.1126/science.122797]
[7]   Action of a smooth flat charged punch on the piezoelectric half-space possessing symmetry of class 6 [J].
Berndt, Edward A. ;
Sevostianov, Igor .
INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE, 2016, 103 :77-96
[8]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[9]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[10]   Potential theory method for 3D crack and contact problems of multi-field coupled media: A survey [J].
Chen W.-Q. ;
Ding H.-J. .
Journal of Zhejiang University-SCIENCE A, 2004, 5 (9) :1009-1021