共 33 条
Aberration-Corrected TEM Imaging of Oxygen Occupancy in YSZ
被引:22
作者:
An, Jihwan
[1
]
Koh, Ai Leen
[2
]
Park, Joong Sun
[1
,4
]
Sinclair, Robert
[3
]
Guer, Turgut M.
[3
]
Prinz, Fritz B.
[1
,3
]
机构:
[1] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Stanford Nanocharacterizat Lab, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
[4] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Environm & Energy Technol Div, Berkeley, CA 94720 USA
关键词:
YTTRIA-STABILIZED ZIRCONIA;
GRAIN-BOUNDARY IMPEDANCE;
SURFACE;
SEGREGATION;
LIMITATIONS;
INTERFACES;
REDUCTION;
D O I:
10.1021/jz4002423
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We present atomic-scale imaging of oxygen columns and show quantitative analysis on the occupancy of the columns in yttria-stabilized zirconia (YSZ) using aberration-corrected TEM operated under the negative Cs condition. Also, individual contributions both from oxygen column occupancy and the static displacement of oxygen atoms due to occupancy change to the observed column intensities of TEM images were systematically investigated using HRTEM simulation. We found that oxygen column intensity is governed primarily by column occupancy rather than by static displacement of oxygen atoms. Utilizing the aberration-corrected TEM capability and HRTEM simulation results, we experimentally verified that oxygen vacancies segregate near the single grain boundary of a YSZ bicrystal The methodology and the high spatial resolution characterization tool employed in the present study provide insights into the distribution of oxygen vacancies in the bulk as well as near grain boundaries and pave the way for further investigation and atomic-scale analysis in other important oxide materials.
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页码:1156 / 1160
页数:5
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