Effects of mechanical grinding and low temperature annealing on crystal structure of Er5Si4

被引:1
作者
Cao, Q. [1 ,2 ]
Chumbley, L. S. [1 ,2 ]
Mudryk, Y. [1 ]
Zou, M. [1 ]
Pecharsky, V. K. [1 ,2 ]
Gschneidner, K. A., Jr. [1 ,2 ]
机构
[1] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[2] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
关键词
X-ray powder diffraction; High resolution powder diffraction; Synchrotron radiation; Phase transition; Peak broadening; Annealing; INDUCED PHASE-TRANSFORMATION; RARE EARTH-GERMANIUM; SILICON; TRANSITION; ALLOYS; PLATES;
D O I
10.1016/j.jallcom.2012.12.102
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The effect of mechanical grinding and subsequent low temperature annealing on the orthorhombic to monoclinic structural transition in the Er5Si4 compound was studied by X-ray powder diffraction using both a conventional laboratory Cu K alpha(1) radiation and a high-energy synchrotron source. A reversible phase transition from the orthorhombic to monoclinic structure occurs as a result of mechanical grinding. Low temperature annealing reverses the transformation and converts the formed monoclinic phase back to the orthorhombic, evidently by relieving residual stress introduced during the grinding. (C) 2013 Published by Elsevier B.V.
引用
收藏
页码:127 / 134
页数:8
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