The influence of sample refraction in the X-ray LLL interferometer

被引:0
作者
Wu, Jie [1 ]
Chen, Jiabi [1 ]
机构
[1] Shanghai Univ Sci & Technol, Sch Med Instrument & Food Engn, Shanghai 200093, Peoples R China
来源
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2015年 / 17卷 / 5-6期
基金
中国国家自然科学基金;
关键词
X-ray; Interferometer; Crystal; Refractive index;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An interferometry method based on the X-ray crystallography is explored to the measurement of refractive index, and a triple Laue-case(LLL) interferometer configuration is formed according to the dynamical theory of X-ray diffraction. Then several aspects about the X-rays refraction phenomenon originated by the sample, the deviation of the X-ray incident angle from the Bragg diffraction angle, and the shift distance of the exit point, are discussed to find the influence of analyzer parameters on the interference signal of the X ray LLL interferometer, and computer simulations are made to reveal the relationship between the analyzer thickness and the shift distance of the exit point, and an optimization scheme about the analyzer parameter are presented to improve the spatial resolution for the X- ray interferometer.
引用
收藏
页码:563 / 567
页数:5
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