Site selectivity of Sm3+ ions in BaBi4-xSmxTi4O15 ceramics and its influence on electrical properties

被引:3
作者
Khokhar, Anita [1 ]
Goyal, Parveen K. [2 ]
Sreenivas, K. [1 ]
机构
[1] Univ Delhi, Dept Phys & Astrophys, Delhi 110007, India
[2] Univ Delhi, Dept Phys, ARSD Coll, New Delhi 110021, India
关键词
Ceramics; X-Ray Diffraction; Raman spectroscopy; Electrical properties; FERROELECTRIC PROPERTIES; RAMAN; TEMPERATURE; SCATTERING; BEHAVIOR; MODES;
D O I
10.1016/j.matlet.2015.08.007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Samarium (Sm) substitution in BaBi4-xSmxTi4O15 for (x=0.00-0.50) is investigated. Raman spectroscopy reveals preferential substitution of Sm3+ for Bi3+ at the A-site up to x=0.20 in the perovskite block, and shows improvement in electrical properties. Beyond x=0.20, partial incorporation of Sm3+ into the (Bi2O2)(2+) layers leads to cationic disorder and a decrease in octahedral distortion resulting in poor dielectric and ferroelectric properties. The un-deviated "rigid layer" mode at 54 cm(-1) up to x=0.20 confirms stability of Bi3+ in the (Bi2O2)(2+) layers over the Bi3+ in the perovskite layers. Reduced electrical conductivity, low dielectric losses and improved ferroelectric polarization are seen for an optimum Sm content of x = 0.20. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:408 / 411
页数:4
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