X-ray standing wave enhanced scattering from mesoporous silica thin films

被引：6
|
作者：
Wu, Longlong [1 ,2 ,3 ]
Liu, Yupu [4 ]
Wang, Xiao [1 ]
Wang, Geng [5 ]
Zhao, Dongyuan [4 ]
Chen, Gang [1 ,2 ,3 ,5 ]
机构：
[1] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
[3] Univ Chinese Acad Sci, 19A Yuquan Rd, Beijing 100049, Peoples R China
[4] Fudan Univ, Dept Chem, Adv Mat Lab, Shanghai 200433, Peoples R China
[5] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
来源：
APPLIED PHYSICS LETTERS | 2017年 / 110卷 / 04期
关键词：
SURFACE-LAYERS; MEMBRANES;
D O I：
10.1063/1.4974922
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
X-ray standing wave enhanced scattering effects are observed in mesoporous silica thin films (MSTFs) deposited on rough indium tin oxide coated glass substrates in grazing-incidence smallangle x-ray scattering studies. The distorted-wave Born approximation theory along with a rigorous wave function analysis is employed to elucidate the dynamical scattering processes occurring in MSTFs. The data analysis is significantly simplified by expressing the x-ray scattering intensity from MSTFs in two separate functions of the wave vector transfer, where the in-plane correlation between neighboring mesopore channels is decoupled from the out-of-plane interference interaction. Remarkable agreement is achieved between experiment and theory. Published by AIP Publishing.
引用
收藏
页数：5
相关论文
共 50 条
  • [1] Ordered mesoporous silica and alumina thin films studied by X-ray scattering
    Klotz, M
    Idrissi-Kandri, N
    Ayral, A
    van der Lee, A
    Guizard, C
    JOURNAL DE PHYSIQUE IV, 2002, 12 (PR6): : 283 - 289
  • [2] Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
    Dourdain, S
    Bardeau, JF
    Colas, M
    Smarsly, B
    Mehdi, A
    Ocko, BM
    Gibaud, A
    APPLIED PHYSICS LETTERS, 2005, 86 (11) : 1 - 3
  • [3] X-ray scattering from thin films and multilayers
    Rafaja, D
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 65 - 70
  • [4] Polarity determination of GaN thin films by X-ray standing wave method
    Yasoshima, T
    Koyama, T
    Akimoto, K
    Ichimiya, A
    Sasaoka, C
    Usui, A
    BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 620 - 623
  • [5] Normal incidence X-ray standing wave analysis of thin gold films
    Satterley, Christopher J.
    Lovelock, Kevin R. J.
    Thom, Ian
    Dhanak, Vinod R.
    Buck, Manfred
    Jones, Robert G.
    SURFACE SCIENCE, 2006, 600 (21) : 4825 - 4828
  • [6] X-ray standing wave studies of bulk crystals, thin films and interfaces
    Lagomarsino, S
    X-RAY AND NEUTRON DYNAMICAL DIFFRACTION: THEORY AND APPLICATIONS, 1996, 357 : 225 - 234
  • [7] X-ray standing wave induced Compton and elastic scattering from thin periodic multilayer structures
    Tiwari, M. K.
    Wang, H.
    Sawhney, K. J. S.
    Nayak, M.
    Lodha, G. S.
    PHYSICAL REVIEW B, 2013, 87 (23)
  • [8] X-ray scattering from thin organic films and multilayers
    Pietsch, U
    Barberka, TA
    Geue, T
    Stommer, R
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 393 - 402
  • [9] Structural characterization of thin layered materials using x-ray standing wave enhanced elastic and inelastic scattering measurements
    Tiwari, M. K.
    Sawhney, K. J. S.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2010, 22 (17)
  • [10] X-ray standing wave measurements of gold nanoparticles in polymeric thin films.
    Guico, RS
    Richter, AG
    Wang, J
    Shull, KR
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U342 - U342
12345