The effect of calcination on the microwave dielectric properties of Ba(Mg1/3Ta2/3)O3

被引:41
作者
Fang, YH
Hu, A
Ouyang, SX
Oh, JJ
机构
[1] Shanghai Univ, Dept Inorgan Mat, Shanghai 201800, Peoples R China
[2] Chinese Bldg Mat Acad, Beijing, Peoples R China
[3] Korea Inst Sci & Technol, Seoul 130650, South Korea
关键词
dielectric properties; calcination; microwave processing;
D O I
10.1016/S0955-2219(01)00356-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, the role of calcination, its effect upon microstructural development and the correlation with dielectric losses at microwave frequencies were investigated. Ceramics with the composition Ba(Mg1.3Ta2/3)O-3 (BMT) were prepared by a conventional mixed-oxide route using controlled calcination. Commercial processing often uses sintering and calcination conditions to modify the dielectric properties of ceramics. However, the mechanism by which the calcination conditions influence the dielectric losses is not clear. The BMT powders were calcinated at 1000-1300 degreesC for 4-10 h in air or flowing oxygen. Resonator samples were then sintered at 1600-1650 degreesC for 3 It. Scanning electron microscopy and X-ray diffraction were used to examine the phase composition and the microstructure of the sintered bodies. The microwave dielectric properties were measured at 10 GHz. We found a significant influence of the calcination conditions on the quality factor (Qf) -value. The influences of the phase composition on dielectric losses appear to dominate those of the microstructure. A significant effect was also found for specimens calcinated in different atmospheres. By controlling the calcination and sintering a pure BMT ceramic with a dielectric constant of 24.5, a Qf -value of 120,000 GHz and an r tau (f) of 6 ppm/degreesC was obtained. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:2745 / 2750
页数:6
相关论文
共 12 条
[1]  
CHEN XM, 1994, J MATER SCI-MATER EL, V5, P244, DOI 10.1007/BF00186194
[2]  
Davies PK, 1997, J AM CERAM SOC, V80, P1727, DOI 10.1111/j.1151-2916.1997.tb03046.x
[3]  
Freer R., 1993, SILICATES LNDUSTRIEL, V9, P191
[4]  
HU A, UNPUB FORMATION BAMG
[5]   BA(ZN1/3TA2/3)O-3 CERAMICS WITH LOW DIELECTRIC LOSS AT MICROWAVE-FREQUENCIES [J].
KAWASHIMA, S ;
NISHIDA, M ;
UEDA, I ;
OUCHI, H .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1983, 66 (06) :421-423
[6]  
Kingery W. D., 1976, INTRO CERAMICS
[7]  
Matsumoto K, 1986, P 6 IEEE INT S APPL, P118
[8]  
NOMURA S, 1982, JPN J APPL PHYS, V21, P624
[9]  
SUGIYAMA M, 1990, CERAM T, V15, P153
[10]  
TSUYOSHI KK, 1983, J AM CERAM SOC, V69, pC82