Simultaneous reduction and N-doping of graphene oxides by low-energy N2+ ion sputtering

被引:21
作者
Zhang, Liang [1 ]
Ye, Yifan [1 ]
Cheng, Dingling [1 ]
Zhang, Wenhua [1 ]
Pan, Haibin [1 ]
Zhu, Junfa [1 ]
机构
[1] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
NITROGEN-DOPED GRAPHENE; X-RAY-ABSORPTION; ELECTRONIC-STRUCTURE; GRAPHITE OXIDE; CARBON; MONOLAYER; SPECTRA; GROWTH;
D O I
10.1016/j.carbon.2013.06.018
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An easy and catalyst-free method was used to obtain N-doped reduced graphene oxides (N-RGO) through low-energy N-2(+) ion sputtering of graphene oxides (GO). The simultaneous reduction and N-doping of GO during the sputtering were systematically investigated by X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure and Raman spectroscopy. The N-doping and reduction levels, which are determined by the N/C and O/C atomic ratios from the quantitative XPS analysis, respectively, can be easily controlled by varying the N-2(+) ion sputtering time. In addition, three different N species, namely, nitrile-like N, graphitic N and pyridinic N, can be distinguished in N-RGO. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:365 / 373
页数:9
相关论文
共 44 条
[1]   Kinetic Study of the Graphite Oxide Reduction: Combined Structural and Gravimetric Experiments under Isothermal and Nonisothermal Conditions [J].
Barroso-Bujans, Fabienne ;
Alegria, Angel ;
Colmenero, Juan .
JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (49) :21645-21651
[2]   Oxygen reduction reactions on pure and nitrogen-doped graphene: a first-principles modeling [J].
Boukhvalov, Danil W. ;
Son, Young-Woo .
NANOSCALE, 2012, 4 (02) :417-420
[3]   The electronic properties of graphene [J].
Castro Neto, A. H. ;
Guinea, F. ;
Peres, N. M. R. ;
Novoselov, K. S. ;
Geim, A. K. .
REVIEWS OF MODERN PHYSICS, 2009, 81 (01) :109-162
[4]   Interpretation of Raman spectra of disordered and amorphous carbon [J].
Ferrari, AC ;
Robertson, J .
PHYSICAL REVIEW B, 2000, 61 (20) :14095-14107
[5]   Formation, stabilities, and electronic properties of nitrogen defects in graphene [J].
Fujimoto, Yoshitaka ;
Saito, Susumu .
PHYSICAL REVIEW B, 2011, 84 (24)
[6]   Probing the Thermal Deoxygenation of Graphene Oxide Using High-Resolution In Situ X-ray-Based Spectroscopies [J].
Ganguly, Abhijit ;
Sharma, Surbhi ;
Papakonstantinou, Pagona ;
Hamilton, Jeremy .
JOURNAL OF PHYSICAL CHEMISTRY C, 2011, 115 (34) :17009-17019
[7]   The rise of graphene [J].
Geim, A. K. ;
Novoselov, K. S. .
NATURE MATERIALS, 2007, 6 (03) :183-191
[8]   Doping graphene with metal contacts [J].
Giovannetti, G. ;
Khomyakov, P. A. ;
Brocks, G. ;
Karpan, V. M. ;
van den Brink, J. ;
Kelly, P. J. .
PHYSICAL REVIEW LETTERS, 2008, 101 (02)
[9]   Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques [J].
Hellgren, N ;
Guo, JH ;
Luo, Y ;
Såthe, C ;
Agui, A ;
Kashtanov, S ;
Nordgren, J ;
Ågren, H ;
Sundgren, JE .
THIN SOLID FILMS, 2005, 471 (1-2) :19-34
[10]   PREPARATION OF GRAPHITIC OXIDE [J].
HUMMERS, WS ;
OFFEMAN, RE .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1958, 80 (06) :1339-1339