Field-emission studies of smooth and nanostructured carbon films

被引:37
|
作者
Merkulov, VI [1 ]
Lowndes, DH
Baylor, LR
机构
[1] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
[2] Oak Ridge Natl Lab, Div Fus Energy, Oak Ridge, TN 37831 USA
关键词
D O I
10.1063/1.124650
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron field-emission measurements of carbon films prepared by pulsed-laser deposition (PLD) and hot-filament chemical-vapor deposition (HF-CVD) are reported. Smooth PLD carbon films, with both high- and low-sp(3) contents, appear to be poor field emitters. In contrast, HF-CVD carbon exhibits very good field-emission properties, including the emission turn-on field as low as 9 V/mu m, high emission site density, and excellent durability. In addition, HF-CVD was carried out at temperatures below 600 degrees C, compatible with the use of glass substrates. The promising field-emission properties of HF-CVD carbon are attributed to the nanostructured nature of this material. (C) 1999 American Institute of Physics. [S0003-6951(99)02235-4].
引用
收藏
页码:1228 / 1230
页数:3
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