Fabrication of single-mode chalcogenide fiber probes for scanning near-field infrared optical microscopy

被引：14
作者：
Schaafsma, DT
Mossadegh, R
Sanghera, JS
Aggarwal, ID
Luce, M
Generosi, R
Perfetti, P
Cricenti, A
Gilligan, JM
Tolk, NH
机构：
[1] USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA
[2] Ist Stuttura Mat, Rome, Italy
[3] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
来源：
OPTICAL ENGINEERING | 1999年 / 38卷 / 08期
关键词：
microscopes; resolution; infrared; fiber optics;
D O I：
10.1117/1.602181
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We fabricate scanning near-field optical microscope (IR-SNOM) probe tips made from singlemode chalcogenide fiber and test them using a standard SNOM setup and free-electron laser. SEM micrographs, showing tips with submicrometer physical dimensions, demonstrate the feasibility of the thermal micropipette puller process used to create the tips. Topographical data obtained using a shear-force nearfield microscope exhibit spatial resolution in the range of 80 to 100 nm. Optical data in the IR (near 3.5 mu m), using the probe tips in collection mode, indicate an optical spatial resolution of approximately lambda/15. (C) 1999 Society of Photo-Optical Instrumentation Engineers. [S0091-3286(99)00108-7].
引用
收藏
页码：1381 / 1385
页数：5
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