Floating body induced pre-kink excess low-frequency noise in submicron SOICMOSFET technology

被引:11
作者
Tseng, YC [1 ]
Huang, WM
Ilderem, V
Woo, JCS
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] Motorola Inc, Embedded Syst Technol Labs, Mesa, AZ 85202 USA
关键词
floating body effect; low-frequency noise; SOI;
D O I
10.1109/55.784460
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The well-known post-kink Lorentzian-like noise overshoot has been empirically correlated to the ac kink effect in the SOI CMOSFET in the past. This work demonstrates the existence of a 1/f(2) excess noise spectrum (<100 Hz) superimposed upon 1/f noise in partially depleted (PD) floating body SOI CMOS when devices are biased in the pre-kink region (before the de kink onset voltage), While the impact ionization phenomenon is negligible in the pre-kink region, the new observed pre-kink excess noise provides a new insight into the body voltage instability and current fluctuation in the SOI CMOSFET.
引用
收藏
页码:484 / 486
页数:3
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