Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

被引：24

作者：

Diaz Caballero, E. ^{[1
]}

Belenguer, A. ^{[2
]}

Esteban, H. ^{[3
]}

Boria, V. E. ^{[3
]}

机构：

[1] Univ Politecn Valencia, Inst Telecomunicac & Aplicac Multimedia, Valencia 46022, Spain

[2] Univ Castilla La Mancha Ingn Elect Elect Automat, Cuenca 16071, Spain

[3] Univ Politecn Valencia, Valencia 46022, Spain

来源：

ELECTRONICS LETTERS | 2013年 / 49卷 / 02期

关键词：

DESIGN;

D O I：

10.1049/el.2012.3027

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit.

引用

页码：132 / U13

页数：2

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