Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems

被引:1
作者
Castro-Marin, Pablo [1 ]
Garduno-Mejia, Jesus [1 ]
Rosete-Aguilar, Martha [1 ]
Bruce, Neil Ch. [1 ]
Reid, Derryck T. [2 ]
Farrell, C. [2 ]
Sandoval-Romero, Gabriel E. [1 ]
机构
[1] Univ Nacl Autonoma Mexico, Ctr Ciencias Aplicadas & Desarrollo Tecnol, Circuito Exterior S-N,Apdo Postal 70-186, Mexico City 04510, DF, Mexico
[2] Heriot Watt Univ, Sch Engn & Phys Sci, Ultrafast Opt Grp, Edinburgh EH14 4AS, Midlothian, Scotland
来源
OPTICAL MODELING AND PERFORMANCE PREDICTIONS VIII | 2016年 / 9953卷
关键词
Femtosecond pulses; spherical and chromatic aberrations; group and phase focusing; FEMTOSECOND PULSES;
D O I
10.1117/12.2238239
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this work we present a method used to study the spherical and chromatic aberrations contribution near the focal point of a refractive optical system. The actual focal position is measured by scanning a pinhole attached on the front of a power detector, which are scanned along the optical axis using a motorized stage with 1 mu m resolution. Spherical aberration contribution was analyzed by changing the pupil aperture, by modifying the size of the input iris diaphragm and for each case, measuring the actual laser power vs the detector position. Chromatic aberration was analyzed by performing the same procedure but in this case we used an ultra-broad-band femtosecond laser. The results between ML and CW operation were compare. Experimental results are presented.
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页数:6
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