RETRACTED: High-temperature piezoelectirc thin films of 0.20BiInO3-0.80PbTiO3 deposited by pulsed laser deposition (Retracted Article)

被引：1

作者：

Wang Wei ^{[1
]}

Tang Jia-Wei ^{[1
]}

Wang Le-Tian ^{[1
]}

Chen Xiao-Bing ^{[1
]}

机构：

[1] Yangzhou Univ, Coll Phys Sci & Technol, Yangzhou 225002, Peoples R China

来源：

ACTA PHYSICA SINICA | 2013年 / 62卷 / 23期

基金：

中国国家自然科学基金;

关键词：

thin films; pulsed laser deposition; ferroelectricity; piezoelectricity; FERROELECTRICS; TRANSITION;

D O I：

10.7498/aps.62.237701

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

High-temperature piezoelectric thin films of 0.20BiInO(3)-0.80PbTiO(3) (20BI-PT) were prepared via pulsed laser deposition and investigated by comparison with 0.15BiInO(3)-0.85PbTiO(3)(15BI-PT). XRD patterns show that (100) peak of 20BI-PT has been split, indicating a higher tetragnality than in 15BI-PT. FESEM images reveal some triangular grains corresponding to [111]-oriented grains in 20BI-PT. The remanent polarization (P-I) and coercive field (E-c) of 20BI-PT are similar to 28 mu C/cm(2) and similar to 120 kV/cm, respectively. It is shown that the transverse piezoelectric coefficient e(31,f) keeps almost the same in 20BI-PT and 15BI-PT. The temperature dependence of dielectric permittivity in 20BI-PT reveals a higher Curie temperature (590 degrees C) than that in 15BI-PT and no apparent frequency dependence is detected. Rayleigh analyses are performed to identify the extrinsic contributions to dielectric nonlinearity for different x. It is seen that x = 0.15 exhibits greater extrinsic contributions to dielectric nonlinearity than the other compositions.

引用

页数：6

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