Josephson scanning tunneling microscopy

被引:40
作者
Smakov, J [1 ]
Martin, I
Balatsky, AV
机构
[1] Royal Inst Technol, Dept Phys, SCFAB, SE-10691 Stockholm, Sweden
[2] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
关键词
D O I
10.1103/PhysRevB.64.212506
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We propose a set of scanning tunneling microscopy experiments in which the surface of a superconductor is scanned by a superconducting tip. Potential capabilities of such experimental setup are discussed. Most important anticipated results of such an experiment include the position-resolved measurement of the superconducting order parameter and the possibility to determine the nature of the secondary component of the order parameter at the surface. The theoretical description based on the tunneling Hamiltonian formalism is presented.
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页数:4
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