Leakage current reduction in pentacene-based thin film transistor using asymmetric source/drain electrodes

被引:6
作者
Lim, Myung-Hoon [1 ]
Lee, In-Yeal [1 ]
Jeong, Seong-Guk [1 ]
Lee, Jongtaek [1 ]
Jung, Woo-Shik [2 ]
Yu, Hyun-Yong [3 ]
Kim, Gil-Ho [1 ]
Roh, Yonghan [1 ]
Park, Jin-Hong [1 ]
机构
[1] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
[2] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[3] Korea Univ, Sch Elect Engn, Seoul 136701, South Korea
基金
新加坡国家研究基金会;
关键词
Asymmetric S/D; Pentacene; OTFT; FIELD-EFFECT TRANSISTORS; CONTACT;
D O I
10.1016/j.orgel.2012.03.009
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, we propose the concept of achieving a lower off-current in organic thin film transistors (OTFTs) by asymmetric source/drain with low and high work-function metals. The artificial hole barrier height (h-BH) at the drain-channel junction formed by this method prevents hole carriers transport from source to drain through the pentacene layer during the off-state. On-current is not affected by this artificially formed h-BH because the effective h-BH is reduced in the on-state. As a result, in the asymmetric Ni-Ti and Ni-Al OTFTs, the off-currents are decreased by 12 and 18.3 times, respectively, compared to that in the symmetric S/D device. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:1056 / 1059
页数:4
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