Reliability Challenges of Real-Time Systems in Forthcoming Technology Nodes

被引：0

作者：

Hamdioui, Said ^{[1
]}

Gizopoulos, Dimitris ^{[2
]}

Guido, Groeseneken ^{[3
,4
]}

Nicolaidis, Michael ^{[5
]}

Grasset, Arnaud ^{[6
]}

Bonnot, Philippe ^{[6
]}

机构：

[1] Delft Univ Technol, Comp Engn, Delft, Netherlands

[2] Univ Athens, Dept Informat, Athens, Greece

[3] Imec Leuven, Leuven, Belgium

[4] Katholieke Univ Leuven, ESAT Dept, Leuven, Belgium

[5] TIMA Lab, Grenoble, France

[6] Thales Res & Technol, Palaiseau, France

来源：

DESIGN, AUTOMATION & TEST IN EUROPE | 2013年

关键词：

Circuit reliability; embedded real-time systems; dependable computing; TRAP GENERATION; DEGRADATION; MODEL;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Forthcoming technology nodes are posing major challenges on the manufacturing of reliable (real-time) systems: process variations, accelerated degradation aging, as well as external and internal noise are key examples. This paper focuses on real-time systems reliability and analyzes the state-of-the-art and the emerging reliability bottlenecks from three different perspectives: technology, circuit/IP and full system.

引用

页码：129 / 134

页数：6

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