A high-energy-resolution resonant inelastic X-ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

被引:77
作者
Sala, M. Moretti [1 ]
Martel, K. [1 ]
Henriquet, C. [1 ]
Al Zein, A. [1 ,2 ]
Simonelli, L. [1 ,3 ]
Sahle, Ch. J. [1 ]
Gonzalez, H. [1 ]
Lagier, M. -C. [1 ]
Ponchut, C. [1 ]
Huotari, S. [1 ,4 ]
Verbeni, R. [1 ]
Krisch, M. [1 ]
Monaco, G. [1 ,5 ]
机构
[1] ESRF, European Synchrotron, 71 Ave Martyrs, F-38000 Grenoble, France
[2] Beirut Arab Univ, Dept Phys, Fac Sci, Beirut 11072809, Lebanon
[3] ALBA Synchrotron Light Facil, Carrer Llum 2-26, Barcelona 08290, Spain
[4] Univ Helsinki, Dept Phys, POB 64, FI-00014 Helsinki, Finland
[5] Univ Trento, Dipartimento Fis, Via Sommarive 14, I-38123 Povo, TN, Italy
关键词
resonant inelastic X-ray scattering; X-ray emission; ID20; beamline; RIXS spectrometer; ESRF; POSITION-SENSITIVE DETECTORS; ANALYZER CRYSTALS; L-3; EDGE; EXCITATIONS; SUPERCONDUCTORS; RIXS; SPECTROSCOPY; SPECTRA;
D O I
10.1107/S1600577518001200
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An end-station for resonant inelastic X-ray scattering and (resonant) X-ray emission spectroscopy at beamline ID20 of ESRF - The European Synchrotron is presented. The spectrometer hosts five crystal analysers in Rowland geometry for large solid angle collection and is mounted on a rotatable arm for scattering in both the horizontal and vertical planes. The spectrometer is optimized for high-energy-resolution applications, including partial fluorescence yield or high-energy-resolution fluorescence detected X-ray absorption spectroscopy and the study of elementary electronic excitations in solids. In addition, it can be used for non-resonant inelastic X-ray scattering measurements of valence electron excitations.
引用
收藏
页码:580 / 591
页数:12
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