Cu passivation for enhanced low temperature (≤300 °C) bonding in 3D integration

被引:24
作者
Lim, D. F. [1 ]
Wei, J. [2 ]
Leong, K. C. [3 ]
Tan, C. S. [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Singapore Inst Mfg Technol, Singapore 638075, Singapore
[3] GLOBALFOUNDRIES Singapore Pte Ltd, Singapore 738406, Singapore
关键词
Copper; Thermo-compression bonding; Self-assembled monolayer; Alkane-thiol; Benzotriazole;
D O I
10.1016/j.mee.2013.01.032
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-assembled monolayer (SAM) of alkane-thiol is applied to provide temporary passivation on Cu surface for protection against oxidation. The SAM is less susceptible to partial desorption when the samples are stored at low temperature and in inert ambient. Surface analysis shows that SAM is effective in retarding surface oxidation and the degree of protection is higher for SAM with longer chain length. Thiol-based SAM also shows better oxidation protection compared to Benzotriazole (BTA) and is readily desorbed away via thermal annealing. Wafer-to-wafer bonding result shows shear strength enhancement in the Cu-Cu bond when the appropriate chain length of SAM is used. Although the longer chain SAM may have provided better protection to the Cu, it is harder to remove by thermal desorption and therefore its overall benefit is minimal. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:144 / 148
页数:5
相关论文
共 16 条
[1]  
Ang XF, 2009, MATER RES SOC SYMP P, V1112, P91
[2]   Process development and bonding quality investigations of silicon layer stacking based on copper wafer bonding [J].
Chen, KN ;
Chang, SM ;
Fan, A ;
Tan, CS ;
Shen, LC ;
Reif, R .
APPLIED PHYSICS LETTERS, 2005, 87 (03)
[3]  
Garrou P., 2008, HDB 3D INTEGRATION T, V1
[4]   Copper Direct Bonding: An Innovative 3D Interconnect [J].
Gueguen, Pierric ;
Di Cioccio, Lea ;
Morfouli, Panagiota ;
Zussy, Marc ;
Dechamp, Jerome ;
Bally, Laurent ;
Clavelier, Laurent .
2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, :878-883
[5]   Oxidation protection of copper surfaces using self-assembled monolayers of octadecanethiol [J].
Hutt, DA ;
Liu, CQ .
APPLIED SURFACE SCIENCE, 2005, 252 (02) :400-411
[6]   Effect of Wet Pretreatment on Interfacial Adhesion Energy of Cu-Cu Thermocompression Bond for 3D IC Packages [J].
Jang, Eun-Jung ;
Hyun, Seungmin ;
Lee, Hak-Joo ;
Park, Young-Bae .
JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (12) :2449-2454
[7]   Room temperature Cu-Cu direct bonding using surface activated bonding method [J].
Kim, TH ;
Howlader, MMR ;
Itoh, T ;
Suga, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (02) :449-453
[8]   Low Temperature Bump-less Cu-Cu Bonding Enhancement with Self Assembled Monolayer (SAM) Passivation for 3-D Integration [J].
Lim, Dau Fatt ;
Wei, Jun ;
Chee Mang Ng ;
Tan, Chuan Seng .
2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, :1364-1369
[9]   REFLECTION INFRA-RED STUDIES OF FILMS FORMED BY BENZOTRIAZOLE ON CU [J].
POLING, GW .
CORROSION SCIENCE, 1970, 10 (05) :359-&
[10]   Bumpless interconnect through ultrafine Cu electrodes by means of surface-activated bonding (SAB) method [J].
Shigetou, A ;
Itoh, T ;
Matsuo, M ;
Hayasaka, N ;
Okumura, K ;
Suga, T .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2006, 29 (02) :218-226