Fully Solution-Processed Sodium Doped ZnO Thin-Film Transistors via a Low-Temperature Aqueous Route

被引:0
作者
Liu, Q. H. [1 ,2 ,3 ]
Zhao, C. [1 ,2 ,3 ]
Zhao, C. Z. [1 ,2 ,3 ]
Mitrovic, I. Z. [2 ]
Hall, S. [2 ]
Xu, W. Y. [4 ]
Yang, L. [5 ,6 ]
Lim, E. G. [1 ,2 ,3 ]
Wang, Q. N. [1 ,2 ]
Wei, Y. L. [1 ,2 ]
Cao, Y. X. [1 ,2 ]
机构
[1] Xian Jiaotong Liverpool Univ, Dept Elect & Elect Engn, Suzhou, Peoples R China
[2] Univ Liverpool, Dept Elect Engn & Elect, Liverpool, Merseyside, England
[3] Xian Jiatong Liverpool Univ, AI Univ Res Ctr AI URC, Suzhou, Peoples R China
[4] Shenzhen Univ, Coll Mat Sci & Engn, Guangdong Res Ctr Interfacial Engn Funct Mat, Shenzhen, Peoples R China
[5] Xian Jiaotong Liverpool Univ, Dept Chem, Suzhou, Peoples R China
[6] Univ Liverpool, Dept Chem, Liverpool L69 7ZD, Merseyside, England
来源
2019 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS) | 2019年
基金
中国国家自然科学基金;
关键词
solution-processed; metal oxide thin-film transistors; low-temperature; aqueous route; FIELD-EFFECT MOBILITY; PERFORMANCE; DEVICE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, we develop a simple and eco-friendly aqueous route for the fabrication of sodium (Na) doped ZnO/AlOx thin-film transistors (TFTs). To prepare Na doped ZnO and AlOx thin films, ammonia water and deionized water were used as the precursor solvents. The AlOx thin film annealed at 300 degrees C showed an areal-capacitance of 129 nF/cm(2) at 1 kHz. On the basis of its implementation as the gate oxide, fully solution-processed Na doped ZnO TFTs were fabricated and the electrical characteristics were systematically studied. The fully solution processed Na doped ZnO/AlOx TFTs exhibited a high field effect mobility of 21 cm(2)V(-1)s(-1), a subthreshold swing of 0.58 V/decade, a threshold voltage of 0.8 V, and an on/off current ratio of 2x10(4).
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页数:4
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