Molecular Reorganization in Organic Field-Effect Transistors and Its Effect on Two-Dimensional Charge Transport Pathways

被引:80
作者
Liscio, Fabiola [1 ]
Albonetti, Cristiano [2 ]
Broch, Katharina [3 ]
Shehu, Arian [2 ]
Quiroga, Santiago David [2 ]
Ferlauto, Laura [1 ]
Frank, Christian [3 ]
Kowarik, Stefan [4 ]
Nervo, Roberto [5 ]
Gerlach, Alexander [3 ]
Milita, Silvia [1 ]
Schreiber, Frank [3 ]
Biscarini, Fabio [2 ]
机构
[1] CNR, IMM, I-40129 Bologna, Italy
[2] CNR, ISMN, I-40129 Bologna, Italy
[3] Univ Tubingen, Inst Angew Phys, D-72076 Tubingen, Germany
[4] Humboldt Univ, Inst Phys, D-12489 Berlin, Germany
[5] ESRF, F-38043 Grenoble, France
关键词
thin film growth; molecular organization; organic field-effect transistors; organic electronics; perylene derivatives; THIN-FILMS; X-RAY; PERCOLATION-THRESHOLD; ALPHA-SEXITHIOPHENE; REAL-TIME; GROWTH; MOBILITY; OSCILLATIONS; ORGANIZATION; TRANSITION;
D O I
10.1021/nn304733w
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Charge transport in organic thin film transistors takes place in the first few molecular layers in contact with the gate dielectric. Here we demonstrate that the charge transport pathways in these devices are extremely sensitive to the orientational defects of the first monolayers, which arise from specific growth conditions. Although these defects partially heal during the growth, they cause depletion of charge carriers in the first monolayer, and drive the current to flow in the monolayers above the first one. Moreover, the residual defects induce lower crystalline order and charge mobility. These results, which are not intuitively explained by electrostatics arguments, have been obtained by combining in situ real time structural and electrical characterization together with ex situ AFM measurements, on thin films of a relevant n-type organic semiconductor, N,N-bis(n-octyI)-dicyanoperylene3,4:9,10-bis dicarboximide grown by sublimation in a quasi-layer-by-layer mode at different substrate temperatures.
引用
收藏
页码:1257 / 1264
页数:8
相关论文
共 49 条
[1]   Coverage dependent adsorption dynamics in hyperthermal organic thin film growth [J].
Amassian, A. ;
Desai, T. V. ;
Kowarik, S. ;
Hong, S. ;
Woll, A. R. ;
Malliaras, G. G. ;
Schreiber, F. ;
Engstrom, J. R. .
JOURNAL OF CHEMICAL PHYSICS, 2009, 130 (12)
[2]   High-resolution mapping of the electrostatic potential in organic thin-film transistors by phase electrostatic force microscopy [J].
Annibale, Paolo ;
Albonetti, Cristiano ;
Stoliar, Pablo ;
Biscarini, Fabio .
JOURNAL OF PHYSICAL CHEMISTRY A, 2007, 111 (49) :12854-12858
[3]  
[Anonymous], PHYS REV LETT
[4]   GROWTH OF CONJUGATED OLIGOMER THIN-FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY [J].
BISCARINI, F ;
ZAMBONI, R ;
SAMORI, P ;
OSTOJA, P ;
TALIANI, C .
PHYSICAL REVIEW B, 1995, 52 (20) :14868-14877
[5]   Scaling behavior of anisotropic organic thin films grown in high vacuum [J].
Biscarini, F ;
Samori, P ;
Greco, O ;
Zamboni, R .
PHYSICAL REVIEW LETTERS, 1997, 78 (12) :2389-2392
[6]   Confocal Raman spectroscopy of α-sexithiophene:: From bulk crystals to field-effect transistors [J].
Brillante, Aldo ;
Bilotti, Ivano ;
Albonetti, Cristiano ;
Moulin, Jean-Francois ;
Stoliar, Pablo ;
Biscarini, Fabio ;
de Leeuw, Dago M. .
ADVANCED FUNCTIONAL MATERIALS, 2007, 17 (16) :3119-3127
[7]   Two-Dimensional Charge Transport in Disordered Organic Semiconductors [J].
Brondijk, J. J. ;
Roelofs, W. S. C. ;
Mathijssen, S. G. J. ;
Shehu, A. ;
Cramer, T. ;
Biscarini, F. ;
Blom, P. W. M. ;
de Leeuw, D. M. .
PHYSICAL REVIEW LETTERS, 2012, 109 (05)
[8]   Correlation between morphology and field-effect-transistor mobility in tetracene thin films [J].
Cicoira, F ;
Santato, C ;
Dinelli, F ;
Murgia, M ;
Loi, MA ;
Biscarini, F ;
Zamboni, R ;
Heremans, P ;
Muccini, M .
ADVANCED FUNCTIONAL MATERIALS, 2005, 15 (03) :375-380
[9]   BIRTH DEATH MODELS OF EPITAXY .1. DIFFRACTION OSCILLATIONS FROM LOW INDEX SURFACES [J].
COHEN, PI ;
PETRICH, GS ;
PUKITE, PR ;
WHALEY, GJ ;
ARROTT, AS .
SURFACE SCIENCE, 1989, 216 (1-2) :222-248
[10]   Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment [J].
Colombi, P. ;
Agnihotri, D. K. ;
Asadchikov, V. E. ;
Bontempi, E. ;
Bowen, D. K. ;
Chang, C. H. ;
Depero, L. E. ;
Farnworth, M. ;
Fujimoto, T. ;
Gibaud, A. ;
Jergel, M. ;
Krumrey, M. ;
Lafford, T. A. ;
Lamperti, A. ;
Ma, T. ;
Matyi, R. J. ;
Meduna, M. ;
Milita, S. ;
Sakurai, K. ;
Shabel'nikov, L. ;
Ulyanenkov, A. ;
Van der Lee, A. ;
Wiemer, C. .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2008, 41 :143-152