X-ray diffraction study of residual elastic stress and microstructure of near-surface layers in nickel-titanium alloy irradiated with low-energy high-current electron beams

被引:27
作者
Meisner, L. L. [1 ,2 ]
Lotkov, A. I. [1 ]
Ostapenko, M. G. [1 ,3 ]
Gudimova, E. Yu. [1 ]
机构
[1] Inst Strength Phys & Mat Sci SB RAS, Tomsk 634021, Russia
[2] Natl Res Tomsk State Univ, Tomsk 634036, Russia
[3] Natl Res Tomsk Polytech Univ, Tomsk 634050, Russia
关键词
Nickel-titanium alloy; Electron beam treatment; Surface layers; X-ray diffraction analysis; Gradient microstructural changes; Residual elastic stresses; THIN-FILMS; CONSTANTS;
D O I
10.1016/j.apsusc.2013.04.168
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the work, we compare quantitative estimates of residual stresses in nickel-titanium (NiTi) alloy surface layers after electron beam treatment. The quantitative estimates to be compared were taken using X-ray diffraction (XRD) techniques with symmetric and asymmetric Bragg diffraction geometries. A method of quantitative X-ray diffraction estimation of residual stresses in materials with gradient changes in microstructure and physical properties, including elastic moduli, is described. It is found that in a NiTi specimen with one side irradiated by a low-energy high-current electron beam, the maximum residual elastic stresses sigma approximate to 550 MPa are localized in the modified surface layer (melted by the electron beam and rapidly quenched), whereas the residual elastic stresses in the underlying layer with initial B2 structure are no greater than similar to 100 MPa. It is for this reason that stress-induced B19' martensite is formed in the material layer beneath the modified layer. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:398 / 404
页数:7
相关论文
共 36 条
  • [1] X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
    Genzel, C
    [J]. MATERIALS SCIENCE AND TECHNOLOGY, 2005, 21 (01) : 10 - 18
  • [2] Genzel C., 2001, Adv. X-ray Anal, V44, P247
  • [3] Genzel CH, 2004, J NEUTRON RES, V12, P233, DOI 10.1080/10238160410001734739
  • [4] Gisen F., 1936, INDIVIDUAL DETERMINA
  • [5] Glocker R., 1932, XRAY BEAMS MAT TESTI
  • [6] Gorelik S. S, 1994, XRAY ELECT OPTICAL A
  • [7] GRISHKOV VN, 1985, FIZ MET METALLOVED+, V60, P351
  • [8] Hauk V, 1997, STRUCTURAL AND RESIDUAL STRESS ANALYSIS BY NONDESTRUCTIVE METHODS, P3, DOI 10.1016/B978-044482476-9/50003-7
  • [9] Hauk V., 2000, Advances in X-ray Analysis, V42, P540
  • [10] Ivanov A. N., 2000, ZAVODSK LAB, P24