Study of Frequency-to-Voltage Converter immunity to fast transient pulses

被引：0

作者：

Gao, Yuan ^{[1
]}

Abouda, Kamel ^{[1
]}

Beges, Remi ^{[1
]}

Besse, Patrice ^{[1
]}

机构：

[1] NXP Semicond, ESD EMC Team Cent Org Automot Div, Toulouse, France

来源：

2016 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC) | 2016年

关键词：

FVC; ISO pulse; immunity; fast transient;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper the susceptibility of a Frequency-to-Voltage Convertor (FVC) to harsh automotive EMC/ESD environment using different system level ISO pulses are investigated by circuit simulations. A simplification methodology of power tree is presented and used for simulation acceleration. We evaluated the performance of the on-chip FCV under several different standard ISO pulses. As the results, we have clarified the mechanism of the FVC malfunction.

引用

页码：849 / 851

页数：3