Aharonov-Bohm type oscillations in the system of two tunnel point-contacts in the presence of single scatterer: determination of the depth of the buried impurity

被引：0

作者：

Khotkevych, N. V. ^{[1
]}

Kolesnichenko, Yu A. ^{[1
]}

van Ruitenbeek, J. M. ^{[2
]}

机构：

[1] Natl Acad Sci Ukraine, BI Verkin Inst Low Temp Phys & Engn, 47 Lenin Ave, UA-61103 Kharkov, Ukraine

[2] Leiden Univ, Kamerlingh Onnes Lab, NL-2300\ Leiden, Netherlands

来源：

26TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT26), PTS 1-5 | 2012年 / 400卷

关键词：

MICROSCOPE;

D O I：

10.1088/1742-6596/400/4/042031

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The conductance of a system containing two tunnel point-contacts and a single subsurface scatterer in the presence of a magnetic field is investigated theoretically. A general formula for the dependence of the conductance on the distance between contacts, the defect position, and the magnetic field is obtained. It is shown that in the presence of a magnetic field the conductance undergoes Aharonov-Bohm type oscillations. We find a simple relation between the period of the oscillations and the depth of the subsurface impurity. On the basis of this fact a new and easy method of determination the depth of the buried impurity is proposed.

引用

页数：4

共 13 条

[1] The signature of subsurface Kondo impurities in the local tunnel current
Avotina, Ye S.
Kolesnichenko, Yu A.
van Ruitenbeek, J. M.
[J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2008, 20 (11)
[2] Magneto-quantum oscillations of the conductance of a tunnel point contact in the presence of a single defect
Avotina, Ye. S.
Kolesnichenko, Yu. A.
Otte, A. F.
van Ruitenbeek, J. M.
[J]. PHYSICAL REVIEW B, 2007, 75 (12):
[3] Theory of oscillations in STM conductance caused by subsurface defects
Avotina, Ye. S.
Kolesnichenko, Yu. A.
[J]. LOW TEMPERATURE PHYSICS, 2010, 36 (10-11) : 849 - 864
[4] Aharonov-Bohm oscillations in the local density of states
Cano, A.
Paul, I.
[J]. PHYSICAL REVIEW B, 2009, 80 (15):
[5] Flatte M E, 1996, PHYS REV B, V53
[6] Stability, resolution, and tip-tip imaging by a dual-probe scanning tunneling microscope
Grube, H
Harrison, BC
Jia, JF
Boland, JJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (12) : 4388 - 4392
[7] Jasninsky P, 2006, REV SCI INSTRUM, V77
[8] Quantum interference effects in a system of two tunnel point-contacts in the presence of a single scatterer: simulation of a double-tip STM experiment
Khotkevych, N. V.
Kolesnichenko, Yu. A.
van Ruitenbeek, J. M.
[J]. LOW TEMPERATURE PHYSICS, 2011, 37 (01) : 53 - 58
[9] KULIK IO, 1974, ZH EKSP TEOR FIZ+, V66, P1051
[10] DOUBLE-TIP SCANNING TUNNELING MICROSCOPE FOR SURFACE-ANALYSIS
NIU, Q
CHANG, MC
SHIH, CK
[J]. PHYSICAL REVIEW B, 1995, 51 (08): : 5502 - 5505

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