Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

被引：40

作者：

Abeykoon, Milinda ^{[1
]}

Malliakas, Christos D. ^{[2
]}

Juhas, Pavol ^{[3
]}

Bozin, Emil S. ^{[1
]}

Kanatzidis, Mercouri G. ^{[2
,4
]}

Billinge, Simon J. L. ^{[1
,3
]}

机构：

[1] Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY 11973 USA

[2] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA

[3] Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USA

[4] Argonne Natl Lab, Div Mat Sci, Chicago, IL 60439 USA

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS | 2012年 / 227卷 / 05期

关键词：

Pair distribution function; Electron diffraction; Nanomaterials; Polycrystalline films; X-RAY-DIFFRACTION; AMORPHOUS MATERIALS; SCALE STRUCTURE; NANOPARTICLES; NANOCRYSTALS;

D O I：

10.1524/zkri.2012.1510

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

引用

页码：248 / 256

页数：9

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