Hot spot formation in focused-ion-beam-fabricated YBa2Cu3O7-x nanobridges with high critical current densities

被引：6

作者：

Lam, Simon K. H. ^{[1
]}

Bendavid, Avi ^{[1
]}

Du, Jia ^{[1
]}

机构：

[1] CSIRO, Mfg Business Unit, POB 218, Lindfield, NSW 2070, Australia

来源：

NANOTECHNOLOGY | 2019年 / 30卷 / 32期

关键词：

high temperature superconducting nanostructure; FIB lithography; yttrium barium copper oxide;

D O I：

10.1088/1361-6528/ab1971

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We report on the fabrication and evaluation of nanoscale YBa2Cu3O7-x (YBCO) constrictions using focused-ion-beam techniques for potential application as YBCO bolometers. A gold protective layer was found to be critical for supressing contamination from gallium ions in order to obtain high critical current densities. Further processing using a radio-frequency plasma to remove the gold protective layer has also been studied and was found to be effective in minimizing sample damage resulting from overheating. Current-voltage measurement indicate that the nanobridges go through the transition from superconducting to normal state with different dissipation mechanism including flux creep and hot spot formation.

引用

页数：8

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