High-speed time-domain characterization method for polygon scanners

被引:4
|
作者
Ji, Youn-Young [1 ]
So, Byung Hwy [1 ]
Kim, Dug Young [1 ]
机构
[1] Yonsei Univ, Dept Phys, Yonseiro 50, Seoul, South Korea
基金
新加坡国家研究基金会;
关键词
Polygon mirror; Polygon scanner; Angle measurement; Laser beam scanning; Scanning confocal microscopy; Laser printer; LASER; REFLECTION;
D O I
10.1016/j.measurement.2018.11.039
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two major advantages of polygon scanners over galvano scanners are their fast scanning speed and linear scanning motion. However, a polygon scanner has a fundamental problem associated with the irregularity of its structure due to unequal facet-to-facet angles. Conventional methods rely on geometrical measurements of the polygon mirror structure; though accurate, they are time-consuming and do not show other scanning errors in the real beam scanning action. We propose a simple and fast time-domain characterization method that can show the structural defects of a polygon mirror as well as other scanning jitter that exists only when it is in motion. A laser beam's optical power passing through a slit is measured using a fast detector and digitizer. By analyzing repeated pulse patterns in the data, we can estimate facet-to-facet angles and other scanning jitter of a polygon mirror. Our proposed method is experimentally demonstrated by measuring three polygon mirrors with 12 facets. (C) 2018 Elsevier Ltd. All rights reserved.
引用
收藏
页码:278 / 286
页数:9
相关论文
共 50 条
  • [21] Modeling of Metasurfaces Using Discontinuous Galerkin Time-Domain Method Based on Generalized Sheet Transition Conditions
    Tian, Shaowen
    Wu, Kaiming
    Ren, Qiang
    IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2022, 70 (08) : 6905 - 6917
  • [22] High-speed truly random number generator based on the random time distribution of single photons
    Wang Long
    Ma Hai-Qiang
    Li Shen
    Wei Ke-Jin
    ACTA PHYSICA SINICA, 2013, 62 (10)
  • [23] Analysis of the accuracy of the numerical reflection coefficient of the finite-difference time-domain method at planar material interfaces
    Christ, A
    Benkler, S
    Fröhlich, J
    Kuster, N
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2006, 48 (02) : 264 - 272
  • [24] Laser Scanner-Stage Synchronization Method for High-Speed And Wide-Area Fabrication
    Kim, Kyunghan
    Yoon, Kwangho
    Suh, Jeong
    Lee, Jaehoon
    JOURNAL OF LASER MICRO NANOENGINEERING, 2012, 7 (02): : 231 - 235
  • [25] Generic real-time uniform K-space sampling method for high-speed swept-Source optical coherence tomography
    Xi, Jiefeng
    Huo, Li
    Li, Jiasong
    Li, Xingde
    OPTICS EXPRESS, 2010, 18 (09): : 9511 - 9517
  • [26] Time-Domain Channel Measurements and Small-Scale Fading Characterization for RIS-Assisted Wireless Communication Systems
    Ren, Yanqing
    Zhou, Mingyong
    Teng, Xiaokun
    Meng, Shengguo
    Tang, Wankai
    Li, Xiao
    Jin, Shi
    Matthaiou, Michail
    IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 2024, 73 (10) : 14127 - 14142
  • [27] Real-time super-resolution imaging by high-speed fluorescence emission difference microscopy
    Rong, Zihao
    Li, Shuai
    Kuang, Cuifang
    Xu, Yingke
    Liu, Xu
    JOURNAL OF MODERN OPTICS, 2014, 61 (16) : 1364 - 1371
  • [28] Time-domain spectral finite element method for analysis of torsional guided waves scattering and mode conversion by cracks in pipes
    Yeung, Carman
    Ng, Ching Tai
    MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2019, 128 : 305 - 317
  • [29] Determination of propellant products by time resolved and spatial distribution LIPS combined with high-speed schlieren imaging
    Zhang, Xinyu
    Li, An
    Zhang, Ying
    Yin, Yunsong
    Wang, Xianshuang
    He, Yage
    Lyv, Jing
    Shan, Yuheng
    Liu, Xiaodong
    Yi, Wen
    Zhong, Lin
    Ren, Yeping
    Xia, Min
    Liu, Ruibin
    JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2024, 39 (03) : 974 - 981
  • [30] A Method for Measuring the Complex Refractive Index of Low-Volume Materials Using Integrated Terahertz Time-Domain Transmissometry
    Pederiva, Raphael
    Artillan, Philippe
    Geffroy, Clement
    Bauerle, Christopher
    Roux, Jean-Francois
    IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2025, 15 (01) : 69 - 75