共 39 条
[1]
Baek IG, 2005, INT EL DEVICES MEET, P769
[2]
Calligaro C., 1995, Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing (Cat. No.95TB8065), P21, DOI 10.1109/MTDT.1995.518077
[3]
A high-speed parallel sensing scheme for multi-level non-volatile memories
[J].
INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, PROCEEDINGS,
1997,
:96-101
[4]
Chang L, 2005, 2005 Symposium on VLSI Technology, Digest of Technical Papers, P128
[5]
Chen YR, 2010, MIDWEST SYMP CIRCUIT, P1109, DOI 10.1109/MWSCAS.2010.5548848
[6]
Chuang C.-T., 2007, Proceedings: International Workshop on Memory Technology, Design, and Testing (MTDT), P4
[7]
E- and √E-model too conservative to describe low field time dependent dielectric breakdown
[J].
2010 INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM,
2010,
:543-548
[8]
Desikan R., 2002, On-chip mram as a high-bandwidth low-latency replacement for dram physical memories
[10]
Dong XY, 2008, DES AUT CON, P554