Effect and mechanism of encapsulation on aging characteristics of quantum-dot light-emitting diodes

被引:78
作者
Chen, Zinan [1 ,2 ]
Su, Qiang [1 ,2 ]
Qin, Zhiyuan [1 ,2 ]
Chen, Shuming [1 ,2 ,3 ]
机构
[1] Southern Univ Sci & Technol, Guangdong Univ Key Lab Adv Quantum Dot Displays &, Shenzhen Key Lab Adv Quantum Dot Displays & Light, Shenzhen 518055, Peoples R China
[2] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
[3] Southern Univ Sci & Technol, Minist Educ, Key Lab Energy Convers & Storage Technol, Shenzhen 518055, Peoples R China
基金
中国国家自然科学基金;
关键词
quantum-dot; light-emitting diodes; positive aging; encapsulation; ZnO defects; DEVICES;
D O I
10.1007/s12274-020-3091-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The aging characteristics, e.g., the evolution of efficiency and luminance of quantum-dot light-emitting diodes (QLEDs) are greatly affected by the encapsulation. When encapsulated with ultraviolet curable resin, the efficiency is increased over time, a known phenomenon termed as positive aging which remains one of the unsolved mysteries. By developing a physical model and an analytical model, we identify that the efficiency improvement is mainly attributed to the suppression of hole leakage current that is resulted from the passivation of ZnMgO defects. When further encapsulated with desiccant, the positive aging effect vanishes. To fully take the advantage of positive aging, the desiccant is incorporated after the positive aging process is completed. With the new encapsulation method, the QLED exhibits a high external quantum efficiency of 20.19% and a half lifetime of 1,267 h at an initial luminance of 2,800 cd center dot m(-2), which are improved by 1.4 and 6.0 folds, respectively, making it one of the best performing devices. Our work provides an in-depth and systematic understanding of the mechanism of positive aging and offers a practical encapsulation way for realizing efficient and stable QLEDs.
引用
收藏
页码:320 / 327
页数:8
相关论文
共 34 条
[1]   High efficiency quantum dot light emitting diodes from positive aging [J].
Acharya, Krishna P. ;
Titov, Alexandre ;
Hyvonen, Jake ;
Wang, Chenggong ;
Tokarz, Jean ;
Holloway, Paul H. .
NANOSCALE, 2017, 9 (38) :14451-14457
[2]   Highly stable QLEDs with improved hole injection via quantum dot structure tailoring [J].
Cao, Weiran ;
Xiang, Chaoyu ;
Yang, Yixing ;
Chen, Qi ;
Chen, Liwei ;
Yan, Xiaolin ;
Qian, Lei .
NATURE COMMUNICATIONS, 2018, 9
[3]   Flexible quantum dot light-emitting devices for targeted photomedical applications [J].
Chen, Hao ;
Yeh, Tzu-Hung ;
He, Juan ;
Zhang, Caicai ;
Abbel, Robert ;
Hamblin, Michael R. ;
Huang, Yingying ;
Lanzafame, Raymond J. ;
Stadler, Istvan ;
Celli, Jonathan ;
Liu, Shun-Wei ;
Wu, Shin-Tson ;
Dong, Yajie .
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2018, 26 (05) :296-303
[4]   On the degradation mechanisms of quantum-dot light-emitting diodes [J].
Chen, Song ;
Cao, Weiran ;
Liu, Taili ;
Tsang, Sai-Wing ;
Yang, Yixing ;
Yan, Xiaolin ;
Qian, Lei .
NATURE COMMUNICATIONS, 2019, 10 (1)
[5]   High-Performance Blue Quantum Dot Light-Emitting Diodes with Balanced Charge Injection [J].
Cheng, Tai ;
Wang, Fuzhi ;
Sun, Wenda ;
Wang, Zhibin ;
Zhang, Jin ;
You, Baogui ;
Li, Yang ;
Hayat, Tasawar ;
Alsaed, Ahmed ;
Tan, Zhan'ao .
ADVANCED ELECTRONIC MATERIALS, 2019, 5 (04)
[6]  
COLVIN VL, 1994, NATURE, V370, P354, DOI 10.1038/370354a0
[7]   Quantum-Dot Light-Emitting Diodes for Large-Area Displays: Towards the Dawn of Commercialization [J].
Dai, Xingliang ;
Deng, Yunzhou ;
Peng, Xiaogang ;
Jin, Yizheng .
ADVANCED MATERIALS, 2017, 29 (14)
[8]   Solution-processed, high-performance light-emitting diodes based on quantum dots [J].
Dai, Xingliang ;
Zhang, Zhenxing ;
Jin, Yizheng ;
Niu, Yuan ;
Cao, Hujia ;
Liang, Xiaoyong ;
Chen, Liwei ;
Wang, Jianpu ;
Peng, Xiaogang .
NATURE, 2014, 515 (7525) :96-99
[9]   Deciphering exciton-generation processes in quantum-dot electroluminescence [J].
Deng, Yunzhou ;
Lin, Xing ;
Fang, Wei ;
Di, Dawei ;
Wang, Linjun ;
Friend, Richard H. ;
Peng, Xiaogang ;
Jin, Yizheng .
NATURE COMMUNICATIONS, 2020, 11 (01)
[10]   Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors [J].
Jeong, Jae Kyeong ;
Yang, Hui Won ;
Jeong, Jong Han ;
Mo, Yeon-Gon ;
Kim, Hye Dong .
APPLIED PHYSICS LETTERS, 2008, 93 (12)