Refractive index of SnS thin nano-crystalline films

被引：21

作者：

Jakhar, Amit ^{[1
]}

Jamdagni, Ashu ^{[1
]}

Bakshi, Ayushi ^{[3
]}

Verma, Taruna ^{[1
]}

Shukla, Vibhav ^{[1
]}

Jain, Priyal ^{[1
,2
]}

Sinha, Nidhi ^{[1
]}

Arun, P. ^{[1
]}

机构：

[1] Univ Delhi, SGTB Khalsa Coll, Dept Elect, Delhi 110007, India

[2] Univ Delhi, Dept Elect Sci, New Delhi 110021, India

[3] Univ Delhi, Dept Phys, Hansraj Coll, Delhi 110007, India

来源：

SOLID STATE COMMUNICATIONS | 2013年 / 168卷

关键词：

Semiconductors; Nanocrystalline materials; Refractive index; OPTICAL-PROPERTIES; BEHAVIOR;

D O I：

10.1016/j.ssc.2013.06.013

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The refractive indices of nano-crystalline thin films of Tin Sulphide (SnS) were investigated here. The experimental data conformed well with the single oscillator model for refractive indices. Based on the this, we explain the increasing trend of refractive index to the improvement in crystal ordering with increasing grain size. (C) 2013 Elsevier Ltd. All rights reserved.

引用

页码：31 / 35

页数：5

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