Expert System based on Wavelets and DELT Measurements for VDSL Systems

被引：0

作者：

Sales, Claudomiro ^{[1
]}

Lima, Vinicius ^{[1
]}

Ikeda, Gustavo ^{[1
]}

Rodrigues, Roberto M. ^{[1
]}

Ericson, Klas

Klautau, Aldebaro ^{[1
]}

Costa, Joao ^{[1
]}

机构：

[1] Fed Univ Para UFPA, BR-66075110 Belem, Para, Brazil

来源：

2012 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM) | 2012年

关键词：

Very high speed digital subscriber line 2 (VDSL2); dual-ended line testing (DELT); loop make-up; LOOP-MAKEUP IDENTIFICATION; SINGLE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Dual-ended line testing (DELT) is a common capability in most current modems and can be used for digital subscriber line (DSL) qualification and monitoring purposes. In spite of that, this feature remains largely unexplored in the literature. This paper proposes a new method based on wavelets and DELT measurements for estimating the total length of the line under test and identification of bridged-taps, two important line parameters that affect the maximum bit rate reached by a DSL line. The proposed method was tested with measurements employing real twisted-pair cables and obtained reasonably accurate results for the analyzed cases.

引用

页码：3110 / 3115

页数：6

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